A LOW POWER BIST TPG FOR HIGH FAULT COVERAGE AND
HIGH EFFICIENCY
Mayank Chakraverty, Ritaban Chakravarty, Vinay Babu, and Kinshuk Gupta
Mayank Chakraverty is with the Semiconductor Research & Development Center, IBM, Bangalore, India (e-mail: nanomayank@yahoo.com).
Ritaban Chakravarty was with New Jersey Institute of Technology, NJ, USA (e-mail: ritaban.87@gmail.com).
Vinay Babu is with Invntree, Bangalore, India (e-mail: vinaygbabu@gmail.com)
Kinshuk Gupta is with the Indian Space Research Organization (ISRO) Satellite Centre, Bangalore, India (e-mail: kinshuk.chandigarh@gmail.com)
Abstract¬¬¬- This paper presents a low hardware overhead test pattern generator (TPG) for scan-based built-in self-test (BIST) that can reduce switching activity in circuits under test (CUTs) during BIST. BIST is a device, here part of the functional device is self dedicated to self-testing the correctness of the device. In general BIST is comprised of two TPGs: LT-RTPG (Low Transition-Random Test Pattern Generator) and 3-Weight WRBIST(Weighted Random Built In Self Test) Minimization of hardware overhead is a major concern of BIST implementation. In test-per-scan BIST, a new test pattern is applied to the inputs of the CUT every m + 1clock cycles, where m is the number of scan elements in the longest scan chain. By using two proposed TPG increasing fault coverage is achieved through the reduction of switching activity, thereby dissipation of power is minimized.
Nowadays, Silicon CMOS is the ultimate winner for the high-speed and/or low power computations and logic race. It is the pillar of the semiconductor industry and the main driver for device scaling. The lithographic process advancement and the integration of new materials (like, SiGe and HfO) [2] with the conventional CMOS had helped in overcoming the key challenge of preserving the low power and high performance which was very hard to maintain due to aggressive scaling [3]–[9].
Abstract— In the last decades, the different IPs were developed and integrated within single chip. The designers were getting lot of issues to verify the chips due to cumbersome of all modules in the IPs. To overcome from such issues, the new technology has been developed. The designer started to develop each module in IP design file. Once it is verified then all modules were combined in single IP and integrated in the chip. Then designer was uploading all IP in a single chip. So the designer can avoid unexpected outputs from the chip. One important problem in the vlsi design is, designer could not be able to find the board level errors in the simulation analysis. The simulator is installed in the computer so that, computer supports all type
The use of nano-materials and extreme precision micro-engineering has the potential for great improvement in the world of electronics and information technology by providing smaller, faster, and more powerful computers and this has been at the forefront of the nanotechnology commercialization . Great examples of how nanotechnology is currently being used in these fields are products such as processors, data storage, and memory components made with nano-materials, TVs, monitors and even smartphone screens that use organic light-emitting diodes (OLED), and waterproof electronics such as smartphones due to the application of nano-coatings
Throughput and productivity were added later, recognizing them as an important factors to evaluate the effectiveness of the test code. Both the factors are discussed at the level of issues i.e. both defects
Moreover, the sign-up and renewal Weblabs associated with Plan variations projects added to the testing complexity. Additionally, the dial-up of the Weblabs not necessarily happened at the same time. So, as part of project sign-off, three combinations executed: i) testing when the renewal Weblab dialed up ii) when the sign-up Weblab dialed up and iii) when all Weblabs in control. So, to complete the QA work efficiently, writing automated tests was critical.
Test Plan: The software is tested using two levels of testing viz. black box testing and white box testing. White box testing could be carried out in three different phases viz. unit testing system/integration testing and validation testing. • Unit Testing: Unit testing, also known as Module Testing, focuses verification efforts on the module. The module is tested separately and this is carried out at the programming stage itself.Unit Test comprises of the set of tests performed by an individual programmer before integration of the unit into the system. Unit test focuses on the smallest unit of software design- the software component or module. Using component level design, important control paths are tested to uncover errors within the boundary of the module. Unit test is white box oriented and the step can be conducted in parallel for
Space. The final frontier. There are approximately one hundred billion galaxies in the universe with many solar systems in each galaxy and many planets within those solar systems (How do we…). The Milky Way Galaxy is close to 100,000 light years in diameter(Diep) with each light year spanning 5.87849981 x 10^12 miles . In comparison, the earth is only 7,917.5 miles in diameter(Coffey). Within and on the earth itself, there are still great mysteries, and so it comes as no surprise that a giant area such as space holds so much mystery. One of the most recent fascinations to astronomers has been asteroids, meteors, meteorites, and comets. These space rocks are found
The goal in this work is to generate robust test architecture optimization for 3D stacked ICs considering the maximum available TAM width in case of uncertainty in TAM configuration. So the problem can be formulated as follows:
Broz, M. et al.:2005, Asteroids, Comets, Meteors Proceedings IAU Symposium No. 229, 2005 D. Lazzaro, S. Ferraz-Mello & J.A. Fern´andez, eds.
The human kind has always been astonished by the wonders of our environment, both in planet Hearth as in outer space. Therefore, due to such astonishment humans always try to learn and understand the environment around them. It is that needing for knowledge and intellectual growth which leads to scientific research and exploration. However, it is outer space exploration which has always gotten into people’s mind since ancient times. As a result of that curiosity, in modern times institutions are created with the only purpose for studying what there is up there. One of those institutions, it is the National Aeronautical and Space Administration, known as NASA.
[11] NASA [Internet]. [NASA] National Aeronautics and Space Administration [cited 2015 January 23]. Available from
April 21st, 1998, almost 18 years ago, wasn’t the most eventful day in history. When researching this day, only one or two things caught my eye, one of which being that NASA had spotted a young solar system outside of ours (Today in History). It was on this day that this discovery had been released to the public. Since this information was released NASA technology has improved immensely. This will discuss how this particular solar system was discovered, also, how NASA’s technology has improved over the years.
Figure 3.2 was created using modified code from the Eagle Space Flight Team. The modified code is not included in Appendix I because it contains many sub functions and would make the length of this lab longer than 20 pages. The code is available upon request by emailing Carl Leake at leakec@my.erau.edu.
is Program Manager in Lockheed Martin's Commercial Space Advanced Programs. He has been with Lockhead Marting for 20 years and the U.S. Army for 5 years. He has a B.S. in mechanical engineering from the United States Military Academy and a M.S. in telecommunications from Denver
Once we began our changes, we had to make more assumptions since we realized that we had to be able to divide the first operation into two parts, as the operation time was 100 seconds, greater than the maximum cycle time needed (90seconds) to achieve our goal of 300 computers in a shift. We also assumed that with an upgrade, we could change the hardware testing software activity time to 50% of the original time. We also assumed we could change the screwing operations to decrease the needed time by changing the action to